Zn2SiO4 and SnO2 nanowires synthesized by thermal ramping technique

Abstract

In this report, nanowires of Zn2SiO4 and SnO2 have been successfully synthesized using a simple novel method namely thermal ramping technique. The technique applies thermal ramping of the sample to a temperature of 900 oC using carbothermal reduction method. This technique requires no carrier gas. Elemental analysis and crystal structure were evaluated using Field Emission Scanning Electron Microscopy (FESEM) , Energy Dispersive X-ray (EDX) and X-ray Diffraction(XRD) analysis. Nanowires of SnO2 and Zn2SiO4 with diameter ranging from 15-25 nm were observed. The effect of Au thickness in synthesizing Zn2SiO4 is also discussed.

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